Advanced Ta-Based Diffusion Barriers for Cu Interconnects
Rene Hubner
It is the aim of this book to carry out microstructure and functional property investigations for advanced, high-performance Ta-based diffusion barriers before and after annealing to compare their thermal stabilities and to probe the corresponding failure mechanisms.
Categories:
Language:
english
Pages:
103
ISBN 10:
1607416751
ISBN 13:
9781607416753
File:
PDF, 1.69 MB
IPFS:
,
english0