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Advanced Ta-Based Diffusion Barriers for Cu Interconnects

Advanced Ta-Based Diffusion Barriers for Cu Interconnects

Rene Hubner
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It is the aim of this book to carry out microstructure and functional property investigations for advanced, high-performance Ta-based diffusion barriers before and after annealing to compare their thermal stabilities and to probe the corresponding failure mechanisms.
Categories:
Language:
english
Pages:
103
ISBN 10:
1607416751
ISBN 13:
9781607416753
File:
PDF, 1.69 MB
IPFS:
CID , CID Blake2b
english0
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