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An InGaP/GaAs Merged HBT-FET (BiFET) Technology and Applications to the Design of Handset Power Amplifiers
Metzger; A.G.; Ramanathan; R.; Jiang Li; Hsiang-Chih Sun; Cismaru; C.; Hongxiao Shao; Rushing; L.; Weller; K.P.; Ce-Jun Wei; Yu Zhu; Klimashov; A.; Tkachenko; Y.A.; Bin Li; Zampardi; P.J
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[IEEE 10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit. Technical Digest 1988. - Nashville, TN, USA (6-9 Nov. 1988)] 10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit. Technical Digest 1988. - Reduction of the backstage effect in GaAs MESFETS by charge confinement at the backgate electrode
Finchem; E.P.; Vetanen; W.A.; Odekirk; B.; Canfield; P.C
22
[IEEE 2011 IEEE International SOI Conference - Tempe, AZ, USA (2011.10.3-2011.10.6)] IEEE 2011 International SOI Conference - TCAD study of back-gate biasing in UTBB
Hook; Terence B.; Furkay; Stephen; Kulkarni; Pranita; Monsieur; Frederic