High resolution X-ray diffractometry and topography
D.K. Bowen, Brian K. Tanner
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.
Categories:
Year:
1998
Edition:
1
Publisher:
Taylor & Francis
Language:
english
Pages:
278
ISBN 10:
0850667585
ISBN 13:
9780850667585
File:
PDF, 11.46 MB
IPFS:
,
english, 1998
Amazon 
Barnes & Noble 
Bookshop.org 
File converter
More search results
More benefits 
Most frequently terms
Related Booklists
