Atomic Force Microscopy Scanning Tunneling Microscopy

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Atomic Force Microscopy Scanning Tunneling Microscopy

Name: Atomic Force Microscopy Scanning Tunneling Microscopy
ISBN: 9780306462979

Samuel H. Cohen, Marcia L. Lightbody

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This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Categories:

Engineering

Year:

1999

Edition:

Publisher:

Springer

Language:

english

Pages:

219

ISBN 10: