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Resonant X-Ray Scattering in Correlated Systems

Resonant X-Ray Scattering in Correlated Systems

Youichi Murakami, Sumio Ishihara (eds.)
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The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Categories:
Year:
2017
Edition:
1
Publisher:
Springer-Verlag Berlin Heidelberg
Language:
english
Pages:
246
ISBN 10:
3662532271
ISBN 13:
9783662532270
Series:
Springer Tracts in Modern Physics 269
File:
PDF, 12.61 MB
IPFS:
CID , CID Blake2b
english, 2017
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