Failure Analysis: High Technology Devices
Daniel J. D. Sullivan, Eric J. CarletonThe book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
- Covers methods and analytical techniques used to find root cause for failures in high technology devices.
- Examples from real experiences in failure analysis laboratories.
- Descriptions of how to perform the wok with details, not just theory.
Year:
2022
Publisher:
De Gruyter
Language:
english
Pages:
128
ISBN 10:
1501524798
ISBN 13:
9781501524790
File:
EPUB, 8.97 MB
IPFS:
,
english, 2022